Evaluation of retracker bias due to waveform fitting method

Chris Ray (Saint Mary's College of California/isardSAT, United States)


Monica Roca (isardSAT, Catalunya); Eduard Makhoul Varona (isardSAT, Catalunya)

Event: 2018 Ocean Surface Topography Science Team Meeting

Session: Instrument Processing: Measurement and Retracking

Presentation type: Type Poster

In the estimation of sea state parameters a retracker induces biases during the fitting of the recorded data by a model waveform. In order to isolate the biases that are due to the method of fitting from the biases that are due to other perturbing influences, simulated waveforms were generated using an idealized model waveform and idealized speckle statistics, and the sea state parameters were estimated from these simulated waveforms using various fitting methods. The methods evaluated were minimum squared error estimation and maximum likelihood estimation for conventional multi-look waveforms, full DDM waveforms, and for ACDC waveforms.

Poster show times:

Room Start Date End Date
Foyer, Salao Nobre & tent Thu, Sep 27 2018,18:00 Thu, Sep 27 2018,20:00
Foyer, Salao Nobre & tent Fri, Sep 28 2018,14:00 Fri, Sep 28 2018,15:00
Chris Ray
Saint Mary's College of California/isardSAT
United States